Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Comparative study of C-V characteristics in Si-NWFET and MOSFET
- Title
- Comparative study of C-V characteristics in Si-NWFET and MOSFET
- Authors
- 정윤하
- Date Issued
- 2010-10-13
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- Nanotechnology Materials and Devices Conference, 2010-10-13
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg