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Intrinsic Reliability Improvement of SiGe Quantum Well pMOSFETs
- Title
- Intrinsic Reliability Improvement of SiGe Quantum Well pMOSFETs
- Authors
- 정윤하
- Date Issued
- 2012-07-26
- Publisher
- IUPAP
- Article Type
- Conference
- Citation
- International Conference on Superlattices, Nanostructures, and Nanodevices, 2012-07-26
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg