DC Field | Value | Language |
---|---|---|
dc.contributor.author | 심재윤 | - |
dc.contributor.author | 한승호 | - |
dc.contributor.author | 이수은 | - |
dc.contributor.author | 최민수 | - |
dc.contributor.author | 박홍준 | - |
dc.contributor.author | 김병섭 | - |
dc.date.accessioned | 2018-06-18T09:11:34Z | - |
dc.date.available | 2018-06-18T09:11:34Z | - |
dc.date.created | 2014-03-03 | - |
dc.date.issued | 2014-02-10 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/65362 | - |
dc.publisher | IEEE | - |
dc.relation.isPartOf | IEEE International Solid-State Circuits Conference | - |
dc.relation.isPartOf | DIGEST OF TECHNICAL PAPERS - IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE | - |
dc.title | A Coefficient-Error-Robust FFE TX with 230% Eye-Variation Improvement Without Calibration in 65nm CMOS Technology | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | IEEE International Solid-State Circuits Conference, pp.50 - 51 | - |
dc.citation.conferenceDate | 2014-02-09 | - |
dc.citation.conferencePlace | US | - |
dc.citation.endPage | 51 | - |
dc.citation.startPage | 50 | - |
dc.citation.title | IEEE International Solid-State Circuits Conference | - |
dc.contributor.affiliatedAuthor | 심재윤 | - |
dc.contributor.affiliatedAuthor | 한승호 | - |
dc.contributor.affiliatedAuthor | 이수은 | - |
dc.contributor.affiliatedAuthor | 최민수 | - |
dc.contributor.affiliatedAuthor | 박홍준 | - |
dc.contributor.affiliatedAuthor | 김병섭 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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