A Coefficient-Error-Robust FFE TX with 230% Eye-Variation Improvement Without Calibration in 65nm CMOS Technology
- Title
- A Coefficient-Error-Robust FFE TX with 230% Eye-Variation Improvement Without Calibration in 65nm CMOS Technology
- Authors
- 심재윤; 한승호; 이수은; 최민수; 박홍준; 김병섭
- Date Issued
- 2014-02-10
- Publisher
- IEEE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/65362
- Article Type
- Conference
- Citation
- IEEE International Solid-State Circuits Conference, page. 50 - 51, 2014-02-10
- Files in This Item:
- There are no files associated with this item.
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