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Analysis of Parasitic Bottom Capacitance in n- and p-type Si-Nanowire Field Effect Transistors on Bulk

Title
Analysis of Parasitic Bottom Capacitance in n- and p-type Si-Nanowire Field Effect Transistors on Bulk
Authors
백창기
Date Issued
2011-08-17
Publisher
IEEE Nanotechnology Council
URI
https://oasis.postech.ac.kr/handle/2014.oak/68461
Article Type
Conference
Citation
2011 11th IEEE International Conference on Nanotechnology, 2011-08-17
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