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Hybrid gate-level 누설 전류 모델의 gate library characterization에 적합한 error metric
- Title
- Hybrid gate-level 누설 전류 모델의 gate library characterization에 적합한 error metric
- Date Issued
- 2015-05-16
- Publisher
- 대한전자공학회
- Article Type
- Conference
- Citation
- 대한전자공학회 SoC 설계연구회학술발표회, 2015-05-16
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Related Researcher
- 김영환KIM, YOUNG HWAN
- Dept of Electrical Enginrg