Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Semiconductor Yield Models Considering Cluster Effect and Fault Observation
- Title
- Semiconductor Yield Models Considering Cluster Effect and Fault Observation
- Authors
- 전치혁
- Date Issued
- 1999-01-17
- Publisher
- SMOMS
- Article Type
- Conference
- Citation
- Int'l Conf on Semiconductor Manufacturing Operational Modeling & Simulation (SMOMS'99), page. 107 - 112, 1999-01-17
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 전치혁JUN, CHI HYUCK
- Dept of Industrial & Management Enginrg