Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 홍유신 | - |
| dc.date.accessioned | 2018-06-21T10:58:01Z | - |
| dc.date.available | 2018-06-21T10:58:01Z | - |
| dc.date.created | 2009-03-27 | - |
| dc.date.issued | 1997-12-01 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/80025 | - |
| dc.publisher | Cairo | - |
| dc.relation.isPartOf | Proc. of the 22nd Int'l Conf. on Computers and Industrial Engineering | - |
| dc.relation.isPartOf | Proc. of the 22nd Int'l Conf. on Computers and Industrial Engineering | - |
| dc.title | A New Cluster Index for Semiconductor Wafer Defects and Simulation-Based Yield Prediction Models | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | Proc. of the 22nd Int'l Conf. on Computers and Industrial Engineering, pp.619 - 622 | - |
| dc.citation.conferencePlace | UA | - |
| dc.citation.endPage | 622 | - |
| dc.citation.startPage | 619 | - |
| dc.citation.title | Proc. of the 22nd Int'l Conf. on Computers and Industrial Engineering | - |
| dc.contributor.affiliatedAuthor | 홍유신 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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