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Nano-probe TEM analyses for thin films and quantum devices
- Title
- Nano-probe TEM analyses for thin films and quantum devices
- Authors
- 박찬경
- Publisher
- 한양대, 서울
- Article Type
- Conference
- Citation
- 한국전자현미경학회 2002 춘계학술대회
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg