Nano-probe TEM analyses for thin films and quantum devices
- Title
- Nano-probe TEM analyses for thin films and quantum devices
- Authors
- 박찬경
- Publisher
- 한양대, 서울
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/90587
- Article Type
- Conference
- Citation
- 한국전자현미경학회 2002 춘계학술대회
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.