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dc.contributor.author김종-
dc.date.accessioned2018-06-25T12:43:54Z-
dc.date.available2018-06-25T12:43:54Z-
dc.date.created2009-03-27-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/91468-
dc.publisher서울대학교, 서울-
dc.relation.isPartOf한국정보과학회 2004년도 추계 학술발표-
dc.relation.isPartOf한국정보과학회 2004 추계 학술발표논문집(A)-
dc.title대용량 메모리의 이웃 패턴 감응 고장의 효율적 테스팅을 위한 메모리 구조-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation한국정보과학회 2004년도 추계 학술발표, pp.649 - 651-
dc.citation.conferenceDate2004-10-01-
dc.citation.endPage651-
dc.citation.startPage649-
dc.citation.title한국정보과학회 2004년도 추계 학술발표-
dc.contributor.affiliatedAuthor김종-
dc.description.journalClass2-
dc.description.journalClass2-

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김종KIM, JONG
Dept of Computer Science & Enginrg
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