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BAEK, ROCK HYUN(백록현)
scopus
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2016
1
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Article
1
Subject
10-nm node
1
DEVICE
1
effective current
1
FINFET
1
FinFET
1
OFF-state current
1
process-induced variability
1
RANDOM DOPANT
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RC delay.
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SOI
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SCIE
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Subject
: FINFET
Date Issued
: 2016
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Article
Process-Induced Variations of 10-nm Node Bulk nFinFETs Considering Middle-of-Line Parasitics
SCIE
SCOPUS
IEEE Transactions on Electron Devices, vol. 63, no. 9, page. 3399 - 3405, 2016-09
Yoon, JS
;
Chang-Ki Baek
;
Baek, RH
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