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BAEK, ROCK HYUN(백록현)
scopus
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2022
1
Type
Article
1
Subject
Carrier mobility
1
Current measurement
1
GRANULARITY
1
IMPACT
1
Logic gates
1
MOSFETS
1
nanowire diameter
1
ON-current
1
PERFORMANCE
1
Resistance
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: Carrier mobility
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: Logic gates
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: ON-current
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: GRANULARITY
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: IMPACT
Subject
: Carrier mobility
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Article
Nanowire Diameter Dependency of the Variability in n/p Silicon Nanowire FETs With Ultrashort Gate Length of 15 nm
SCIE
SCOPUS
IEEE Transactions on Electron Devices, vol. 69, no. 12, page. 6529 - 6534, 2022-12
Lee, Seunghwan
;
Yoon, Jun-Sik
;
Baek, Rock-Hyun
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