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KANG, BONG KOO(강봉구)
Department
Dept of Electrical Engineering(전자전기공학과)
Major(s)
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    Keyword

    Publication & Time Cited Count (For the Last 5 years)

    Results 1-4 of 4 (Search time: 0.001 seconds).
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    Date issued

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    Date Issued : [2010 TO 2019] Date Issued : 2012
    Conference
    Enhanced degradation of n-MOSFETs with high-k/metal gate stacks under channel hot-carrier/gate-induced drain leakage alternating stress

    European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2012-10-01

    Conference
    Effect of electron–electron scattering at an elevated temperature on device

    European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2012-10-01

    Conference
    Channel width dependence of mechanical stress effects induced by shallow

    European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2012-10-01

    Conference
    The Effects of Films Thickness and Sn Concentrations on Solution Processed ZTO Thin Film Transistors Properties

    Thin Films Society, 2012-07-14

    1
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