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KANG, BONG KOO(강봉구)
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2012
1
Type
Article
1
Subject
CHANNEL MOSFETS
1
DEGRADATION
1
GENERATION
1
IMPACT
1
MECHANISM
1
MODEL
1
N-CHANNEL
1
RELIABILITY
1
STRESS
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SCIE
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SCOPUS
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Applied search limites :
Subject
: IMPACT
Journal Registered
: scie
Date Issued
: 2012
Subject
: MODEL
Subject
: DEGRADATION
Subject
: MODEL
Subject
: STRESS
Date Issued
: 2012
Subject
: CHANNEL MOSFETS
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Conference Papers(Domestic)
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Article
Effect of electron-electron scattering at an elevated temperature on device lifetime of nanoscale nMOSFETs
SCIE
SCOPUS
Microelectronics Reliability, vol. 52, no. 9, page. 1905 - 1908, 2012-09
Lee, S
;
Kim, D
;
Kim, C
;
Lee, NH
;
Kim, GJ
;
et al
1
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