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KANG, BONG KOO(강봉구)
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2006
1
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Article
1
Subject
DEVICES
1
interface state
1
NBTI
1
negative bias temperature instabi...
1
NITROGEN
1
oxynitride gate dielectric
1
reliability of MOSFET
1
SILICON
1
STRESS
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threshold voltage
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SCIE
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SCOPUS
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Article
Time-dependent degradation due to negative bias temperature instability of p-MOSFET with an ultra-thin SiON gate dielectric
SCIE
SCOPUS
MICROELECTRONIC ENGINEERING, vol. 83, no. 3, page. 520 - 527, 2006-03
Han, SU
;
Kang, HS
;
Kang, BK
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