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KANG, BONG KOO(강봉구)
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.0 seconds).
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Date issued
2018
1
Type
Article
1
Subject
CHARGE
1
DEPENDENT DEGRADATION
1
Fast hole trapping
1
Fast measurement
1
Interface trap
1
INTERFACE TRAPS
1
MOSFETS
1
NBTI
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NITROGEN
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SILICON
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SCIE
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SCOPUS
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: INTERFACE TRAPS
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: Fast measurement
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: CHARGE
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Article
Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability
SCIE
SCOPUS
MICROELECTRONICS RELIABILITY, vol. 88-90, page. 191 - 195, 2018-09
Yun, Yeohyeok
;
Kim, Gang-Jun
;
Seo, Ji-Hoon
;
Son, Donghee
;
Kang, Bongkoo
1
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