Open Access System for Information Sharing
All
Title
Author
Subject
Login
Library
Help
검색
HOME
Communities & Collections
Researchers
Title
Browse by Researchers
KANG, BONG KOO(강봉구)
Department
Dept of Electrical Engineering(전자전기공학과)
Major(s)
-
E-Mail
×
E-Mail
Homepage
Co-researchers
네트워크
×
공저자 목록
뒤로가기
Keyword
Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
Export
EXCEL
BIBTEX
Date issued
2008
1
Type
Article
1
Subject
gate dielectric
1
GENERATION
1
IMPACT
1
LIFETIME
1
MOSFET
1
negative bias temperature instabi...
1
POSITIVE CHARGE
1
reliability
1
silicon oxynitride
1
STRESS
1
next >
Journal Registered
SCIE
1
SCOPUS
1
Applied search limites :
Subject
: IMPACT
Date Issued
: 2008
Journal Papers(International)
Journal Papers
(Domestic)
Conference Papers(International)
Conference Papers(Domestic)
20 건
100 건
200 건
Article
Recovery of negative bias temperature instability induced degradation of p-MOSFETs with SiON gate dielectric
SCIE
SCOPUS
MICROELECTRONIC ENGINEERING, vol. 85, no. 9, page. 1932 - 1936, 2008-09
Kim, YD
;
Han, SU
;
Kang, HS
;
Kang, BK
1
Browse
Communities & Collections
Researcher
Title
Login
Library
Help