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JEONG, YOON HA(정윤하)
Department
Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2014
1
Type
Article
1
Subject
low frequency noise
1
Nanowire FET
1
switched biasing 1/f noise
1
Journal Registered
SCIE
1
SCOPUS
1
Applied search limites :
Date Issued
: [2010 TO 2016]
Date Issued
: 2014
Subject
: switched biasing 1/f noise
Date Issued
: 2014
Journal Papers(International)
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(Domestic)
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Conference Papers(Domestic)
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Article
Investigation of Low-Frequency Noise in p-type Nanowire FETs: Effect of Switched Biasing Condition and Embedded SiGe Layer
SCIE
SCOPUS
IEEE ELECTRON DEVICE LETTERS, vol. 35, no. 7, page. 702 - 704, 2014-07
Lee, SH
;
Kim, YR
;
Hong, JH
;
Jeong, EY
;
Yoon, JS
;
et al
1
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