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JEONG, YOON HA(정윤하)
Department
Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.0 seconds).
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Date issued
2011
1
Type
Article
1
Subject
1/f
1
Flicker noise
1
gate-all-around (GAA) FET
1
quantum wire
1
series resistance R-sd
1
twin silicon nanowire FET (TSNWFET)
1
Journal Registered
SCIE
1
SCOPUS
1
Applied search limites :
Date Issued
: 2011
Subject
: 1/f
Subject
: gate-all-around (GAA) FET
Subject
: twin silicon nanowire FET (TSNWFET)
Subject
: twin silicon nanowire FET (TSNWFET)
Subject
: series resistance R-sd
Subject
: quantum wire
Type
: Article
Journal Papers(International)
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(Domestic)
Conference Papers(International)
Conference Papers(Domestic)
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Article
Characterization and Modeling of 1/f Noise in Si-nanowire FETs: Effects of Cylindrical Geometry and Different Processing of Oxides
SCIE
SCOPUS
IEEE TRANSACTIONS ON NANOTECHNOLOGY, vol. 10, no. 3, page. 417 - 423, 2011-05
Baek, RH
;
BAEK, CHANG KI
;
Choi, HS
;
Lee, JS
;
Yeoh, YY
;
et al
1
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