DISPLAYS, vol. 3, no. 3, page. 97 - 107, 2006-07
Microelectronics Reliability, vol. 64, page. 194 - 198, 2016-09
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2012-10-01
Microelectronics Reliability, vol. 52, no. 9-10, page. 1949 - 1952, 2012-09
ESREF 2016(the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2016-09-21
ESRF2019, 2019-09-24
IWDTF 2019, 2019-11-19
2nd Korea-China Sym. on Ion Beam Modification of Materials and Thin Film Materials, 1995-01-01
The 1997 Joint International Meeting of the Electrochemical Society, 1997-09-30
JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 59, 2020-07
IWDTF 2019, 2019-11-19
MICROELECTRONICS RELIABILITY, vol. 100-101, 2019-09
ESRF2019, 2019-09-24
IEEE TRANSACTIONS ON PLASMA SCIENCE, vol. 31, no. 3, page. 362 - 368, 2003-06
ENERGIES, vol. 13, no. 6, 2020-03
ENERGIES, vol. 12, no. 7, 2019-04
Microelectronics Reliability, vol. 59, page. 13 - 17, 2016-04
Asia Pacific Microwave Conference, 1997-12-02
Asia Pacific Microwave Conference, 1997-12-02
Free Electron Laser Conference, 2009-08-26