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Browsing by AuthorRahul Rao

전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Showing results 1 to 6 of 6

Conference

Bias Temperature Instability Model for Digital Circuits – Predicting Instantaneous FET Response

IEEE International Reliability Physics Symposium (IRPS), page. 2.1 - 2.4, 2011-04-10

Conference

PBTI/NBTI Monitoring Ring Oscillator Circuits with On-Chip Vt Characterization and High Frequency AC Stress Capability

Symposium on VLSI Circuits, page. 224 - 225, 2011-06-17

Conference

Reliability Monitoring Ring Oscillator Structures for Isolated/Combined NBTI and PBTI Measurement in High-K Metal Gate Technologies

IEEE International Reliability Physics Symposium (IRPS), page. 4.1 - 4.4, 2011-04-10

Article

Slew-Rate Monitoring Circuit for On-Chip Process Variation DetectionSCIESCOPUS

IEEE Transaction on VLSI, vol. 21, no. 9, page. 1683 - 1692, 2013-09

Article

SRAM Write-Ability Improvement with Transient Negative Bit-Line VoltageSCIESCOPUS

IEEE Trans. on VLSI Systems, vol. 19, no. 1, page. 24 - 32, 2011-01

Conference

Usage-Based Degradation of SRAM Array due to Bias Temperature Instability

IEEE International Reliability Physics Symposium (IRPS), page. 6.1 - 6.4, 2012-04-18

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