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Holistic Analysis of Asymmetry in Vertical Silicon Gate-all-around Nanosheet FETs
- Title
- Holistic Analysis of Asymmetry in Vertical Silicon Gate-all-around Nanosheet FETs
- Date Issued
- 2023-09-08
- Publisher
- 2023 SSDM
- Article Type
- Conference
- Citation
- 2023 International Conference on Solid State Devices and Materials (SSDM), 2023-09-08
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg