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전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Article

Performance and Variations Induced by Single Interface Trap of Nanowire FETs at 7-nm NodeSCIESCOPUS

IEEE Transaction on Electron Devices, vol. 64, no. 2, page. 339 - 345, 2017-02

Article

Process-Induced Variations of 10-nm Node Bulk nFinFETs Considering Middle-of-Line ParasiticsSCIESCOPUS

IEEE Transactions on Electron Devices, vol. 63, no. 9, page. 3399 - 3405, 2016-09

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