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KANG, BONG KOO(강봉구)

Department: Dept of Electrical Engineering(전자전기공학과)

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Publication & Time Cited Count (For the Last 5 years)

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Date Issued : [2010 TO 2019] Date Issued : 2019

Conference

Channel-length dependence of the generation of interface states and oxide-trapped charges on drain avalanche hot carrier degradation of HfSiON/SiO2 p-channel MOSFETs with strained Si/SiGe channel

IWDTF 2019, 2019-11-19

Conference

Analysis of Positive Bias Temperature Instability Degradation in n+ and p+ poly-Si Gates of High-Voltage SiO2 Dielectric nMOSFETs

IWDTF 2019, 2019-11-19

Conference

Characterization of fast relaxation by oxide-trapped charges under BTI stress on 64-nm HfSiON/SiO2 MOFSETs

IWDTF 2019, 2019-11-19

Conference

High Efficiency DC-DC Buck Converter with a Passive Snubber Circuit

EDPE 2019, 2019-09-24

Conference

Channel-length dependence of mechanical stress effect by hybrid shallow trench isolation on NBTI degradation of HfSiON/SiO2 p-channel MOSFETs with strained Si/SiGe channel

ESRF2019, 2019-09-24

Conference

Characterization of Positive Bias Temperature Instability Concerning Interfacial Layer Thickness of HfSiON/SiO2 nMOSFET

ESRF2019, 2019-09-24

Conference

Effect of oxide-trapped charge on the anomalous drain avalanche hot carrier degradation of a SiO2 dielectric nMOSFET

ESRF2019, 2019-09-24

Conference

Effect of HfSiON thickness on electron trap distributions of HfSiON/SiO2 nMOSFET under PBTI

ESRF2019, 2019-09-24

Conference

Systematic analysis of electron traps of HfSiON/SiO2 nMOSFETs using TSCIS

2019 International Conference on Solid State Devices and Materials, 2019-09-02

Conference

Active Charge Equalizer of Battery Cells Using Double Energy Carriers

INTERNATIONAL CONFERENCE On RENEWABLE ENERGY(ICREN 2019), 2019-04-25

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