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KANG, BONG KOO(강봉구)
Department
Dept of Electrical Engineering(전자전기공학과)
Major(s)
-

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    Keyword

    Publication & Time Cited Count (For the Last 5 years)

    Results 21-26 of 26 (Search time: 0.001 seconds).
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    Date Issued : [2010 TO 2019]
    Conference
    Effect of electron–electron scattering at an elevated temperature on device

    European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2012-10-01

    Conference
    Channel width dependence of mechanical stress effects induced by shallow

    European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2012-10-01

    Conference
    The Effects of Films Thickness and Sn Concentrations on Solution Processed ZTO Thin Film Transistors Properties

    Thin Films Society, 2012-07-14

    Conference
    Impact of OFF-state Degradation under Dynamic Stress on Reliability of Nanoscale n-Channel Metal-Oxide Semiconductor Field-Effect Transistors at Elevated Temperature

    SSDM(International Conference on Solid State Devices and Materials), 2011-09-29

    Conference
    The Effect of La2O3 Capping Layer Thickness on Hot Carrier Degradation of n-MOSFETs with High-k/Metal Gate Stack

    SSDM(International Conference on Solid State Devices and Materials), 2011-09-28

    Conference
    High-Efficiency Direct-Linked Zeta Converter for LED Backlight Units

    SID(Society for Information Display), 2011-05-15

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