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KANG, BONG KOO(강봉구)
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
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Date issued
2014
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Article
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Electron trap
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FN stress
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GATE
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GATE DIELECTRIC STACKS
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High-k dielectrics
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INTERFACE TRAPS
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MECHANISM
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Positive bias temperature instabi...
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Shallow traps
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SCIE
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SCOPUS
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: Electron trap
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Article
Voltage dependent degradation of HfSiON/SiO2 nMOSFETs under positive bias temperature instability
SCIE
SCOPUS
MICROELECTRONICS RELIABILITY, vol. 54, no. 11, page. 2383 - 2387, 2014-11
Kim, C
;
Kim, H
;
Kang, B
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