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JEONG, YOON HA(정윤하)

Department: Dept of Electrical Engineering(전자전기공학과)

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Publication & Time Cited Count (For the Last 5 years)

Results 1-9 of 9 (Search time: 0.002 seconds).

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Subject : PERFORMANCE

Article

Physical DC and Thermal Noise Models of 18 nm Double-Gate Junctionless pMOSFETs for Low Noise RF ApplicationsSCIESCOPUS

JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 54, no. 4, page. 4DC08-1 - 4DC08-6, 2015-04

Article

Improved Degradation and Recovery Characteristics of SiGe p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors under Negative-Bias Temperature StressSCIESCOPUS

Japanese Journal of Applied Physics, vol. 52, no. 4, page. 4CC21-1 - 4CC21-4, 2013-04

Article

Atomic layer deposition of Al2O3 on V2O5 xerogel film for enhanced lithium-ion intercalation stabilitySCIESCOPUS

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, vol. 30, no. 1, page. 1A123-1 - 1A123-6, 2012-01

Article

The Effect of a Si Capping Layer on RF Characteristics of High-k/Metal Gate SiGe Channel pMOSFETsSCIESCOPUS

IEEE ELECTRON DEVICE LETTERS, vol. 31, no. 10, page. 1104 - 1106, 2010-10

Article

Failure Analysis of Si Nanowire Field-Effect Transistors Subject to Electrostatic Discharge StressesSCIESCOPUS

IEEE ELECTRON DEVICE LETTERS, vol. 31, no. 9, page. 915 - 917, 2010-09

Article

Light scattering with oxide nanocrystallite aggregates for dye-sensitized solar cell applicationSCIESCOPUS

JOURNAL OF NANOPHOTONICS, vol. 4, page. 41540, 2010-05-06

Article

Effects of Lithium Ions on Dye-Sensitized ZnO Aggregate Solar CellsSCIESCOPUS

CHEMISTRY OF MATERIALS, vol. 22, no. 8, page. 2427 - 2433, 2010-04-27

Article

Comparison of Series Resistance and Mobility Degradation Extracted from n- and p-Type Si-Nanowire Field Effect Transistors Using the Y-Function TechniqueSCIESCOPUS

JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 49, no. 4, page. 4DN06-01 - 4DN06-05, 2010-04

Article

Enhanced current-voltage characteristics of Al0.25Ga0.75As/In0.25Ga0.75As/GaAs P-HEMTs using an inverted double channel structureSCIESCOPUS

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, vol. 37, no. 3B, page. 1377 - 1379, 1998-03

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