Open Access System for Information Sharing

JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 53, no. 4, 2014-04

SSDM(International Conference on Solid State Devices and Materials), 2013-09-23

Microelectronics Reliability, vol. 52, no. 9, page. 1905 - 1908, 2012-09

European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2012-10-01

MICROELECTRONICS RELIABILITY, vol. 100, 2019-09

ESRF2019, 2019-09-24

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, vol. 146, no. 9, page. 3489 - 3493, 1999-09

Japanese Journal of Applied Physics, vol. 51, no. 2, 2012-02

The 4th International Symposium on Plasma Process-Induced Damage, 1999-05-09

The 4th International Symposium on Plasma-Process Induced Damage, page. 188 - 191, 1999-05-10

Microelectronic Reliability, vol. 53, no. 9-11, page. 1351 - 1354, 2013-09

European Symposium on Reliability of Electron Devices,Failure Physics and Analysis, 2013-09-30

IEEE ELECTRON DEVICE LETTERS, vol. 32, no. 7, page. 856 - 858, 2011-07

MICROELECTRONICS RELIABILITY, vol. 100, 2019-09

ESRF2019, 2019-09-24

MICROELECTRONIC ENGINEERING, vol. 83, no. 3, page. 415 - 422, 2006-03

DISPLAYS, vol. 28, no. 2, page. 68 - 73, 2007-04

SSDM'94, 1994-08-01

International Conference on Solid State Devices and Materials, 1994-06-23

SOLID-STATE ELECTRONICS, vol. 49, no. 8, page. 1335 - 1340, 2005-08