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Showing results 1 to 9 of 9
Conference
3차원 원자탐침 전자현미경을 이용한 Si 기판에 패터닝 된 Fin 구조 내 도핑 원소분석

제19회 한국반도체학술대회, 2012-02-15

Conference
Atom Probe Tomography Analyses of Thin poly-Si/SiO2 Multi-layer and Appropriate

추계 금속재료학회, 2013-10-24

Conference
Atom Probe Tomography Analysis of Thin Si/SiO2 Multi-layer Film and

MRS fall 2013, 2013-12-01

Conference
Characterization of Plasema-doped Si Fin Structure by Atom Probe Tomography

춘계 금속재료학회, 2013-04-25

Conference
Dimensional Analyses of Dopants in Fin Structure By using Atom Probe Tomography

APMC 2012, 2012-02-05

Conference
Effect of In-composition Fluctuation on Luminescence Efficiency of InGaN Based LED

대한재료금속학회 추계학술대회, 2009-10-22

Conference
Microstructural Evolution of the Ni Sillicide Grown on Amorphous Si

대한재료금속학회 춘계학술대회, 2009-04-23

Conference
Nano-scale Analysis on the Transformation Behavior and Mechanical

춘계 금속재료학회, 2013-04-25

Conference
비정질 Si 에서의 Ni 실리사이드 형성

대한금속재료학회 추계학술대회, 2008-10-01

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