MICROELECTRONIC ENGINEERING, vol. 88, no. 12, page. 3411 - 3414, 2011-12
Semiconductor Science and Technology, vol. 29, no. 10, page. 104006 - 104010, 2014-10
IEEE TRANSACTIONS ON NANOTECHNOLOGY, vol. 3, no. 3, page. 377 - 382, 2004-09
IEEE ELECTRON DEVICE LETTERS, vol. 30, no. 7, page. 760 - 762, 2009-07
MICROELECTRONIC ENGINEERING, vol. 95, page. 71 - 73, 2012-07
IEEE TRANSACTIONS ON CONSUMER ELECTRONICS, vol. 52, no. 3, page. 953 - 961, 2006-08
METALS AND MATERIALS INTERNATIONAL, vol. 17, no. 3, page. 413 - 416, 2011-06
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, vol. E88-A, no. 6, page. 1416 - 1424, 2005-06
Ultramicroscopy, vol. 132, page. 248 - 257, 2013-09
MICROELECTRONIC ENGINEERING, vol. 86, no. 3, page. 268 - 271, 2009-03
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, vol. 40, no. 3B, page. 2054 - 2057, 2001-03
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, vol. 22, no. 5, page. 2375 - 2379, 2004-09
NEUROPSYCHOLOGY, vol. 27, no. 4, page. 428 - 437, 2013-07
NEUROLOGY, vol. 68, no. 11, page. 862 - 864, 2007-03-13
METALS AND MATERIALS INTERNATIONAL, vol. 16, no. 2, page. 197 - 203, 2010-04
Ultramicroscopy, vol. 127, page. 114 - 118, 2013-04
IEEE ELECTRON DEVICE LETTERS, vol. 29, no. 6, page. 565 - 567, 2008-06
INSTITUTE OF PHYSICS CONFERENCE SERIES, vol. 145, page. 775 - 778, 1996-01
METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, vol. 39A, no. 6, page. 1426 - 1434, 2008-06
SCIENTIFIC REPORTS, vol. 5, 2015-05-05