IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 33, no. 12, page. 10539 - 10549, 2018-12
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, vol. 65, no. 11, page. 8697 - 8706, 2018-11
IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 33, no. 10, page. 8808 - 8817, 2018-10
MICROELECTRONICS RELIABILITY, vol. 88-90, page. 186 - 190, 2018-09
MICROELECTRONICS RELIABILITY, vol. 88-90, page. 191 - 195, 2018-09
IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 33, no. 3, page. 2026 - 2034, 2018-03
Miroelectonic Reliabilty, vol. 72, page. 98 - 102, 2017-05
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, vol. 64, no. 2, page. 1251 - 1257, 2017-02
IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 32, no. 1, page. 433 - 440, 2017-01
Japanese Journal of Applied Physics, vol. 56, no. 1, 2016-11
Microelectronics Reliability, vol. 64, page. 194 - 198, 2016-09
JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 55, no. 8, 2016-08
Microelectronics Reliability, vol. 59, page. 13 - 17, 2016-04
IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 30, no. 10, page. 5776 - 5782, 2015-10
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, vol. 62, no. 9, page. 5491 - 5501, 2015-09
IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 29, no. 12, page. 6332 - 6341, 2014-12
MICROELECTRONICS RELIABILITY, vol. 54, no. 11, page. 2383 - 2387, 2014-11
JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 53, no. 8, page. 10 - 13, 2014-08
DISPLAYS, vol. 35, no. 2, page. 66 - 73, 2014-04
JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 53, no. 4, 2014-04