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JUN, CHI HYUCK(전치혁)
Department
Dept of Industrial & Management Engineering(산업경영공학과)
Major(s)
-

Co-researchers

    Keyword

    Publication & Time Cited Count (For the Last 5 years)

    Results 41-59 of 59 (Search time: 0.001 seconds).
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    Conference
    Channel Occupancy Time of Overflow Calls in Hierarchical Cellular Systems

    INFORMS San Antonio 2000, 2000-11-05

    Conference
    Performance Analysis of Cellular Mobile Communication Systems Considering General Distribution for Call Duration and Cell Residence Times

    Proceedings of the 26th International Conference on Computers & Industrial Engineering, page. 101 - 105, 1999-12-15

    Conference
    A Class of Contagious Distributions and Semiconductor Yield Models

    Proceedings of the 26th International Conference on Computers & Industrial Engineering, page. 75 - 79, 1999-12-15

    Conference
    An Approximate Analysis of a Shared-Buffer ATM Switch with a Single Hot-Spot via Input Process Aggregation and Switch Decomposition

    Proceedings of SPIE International Conference on Performance and Control of Network Systems, page. 102 - 109, 1999-09-19

    Conference
    Soft Handoff Algorithm with Pilot Signal Thresholds Adjustment in CDMA Cellular Systems

    Proceedings of 1999 IEEE TENCON, page. 498 - 501, 1999-09-15

    Conference
    An Approximate Analysis of a Shared Buffer ATM Switch Using Input Process Aggregation Technique

    Proceedings of 1999 2nd International Conference on ATM (ICATM'99), page. 447 - 455, 1999-06-21

    Conference
    Semiconductor Yield Models Considering Cluster Effect and Fault Observation

    Int'l Conf on Semiconductor Manufacturing Operational Modeling & Simulation (SMOMS'99), page. 107 - 112, 1999-01-17

    Conference
    A Class of Generalized Contagious Distributions: Using in the Yield Model

    Proc. of the 1st Korea-Japan Joint Conf. On Industrial Engineering and Management, 1998-10-30

    Conference
    A Bayesian Approach to a Periodic Incomplete Preventive Maintenance Model

    Proceedings of the fourth ISSAT International Conference on Reliability and Quality in Design, page. 184 - 188, 1998-08-12

    Conference
    A New Cluster Index for Semiconductor Wafer Defects and Simulation-based Yield Prediction Models

    Proceedings of the 22nd ICC&IE, page. 619 - 622, 1997-12-20

    Conference
    Determination of Feasible Region Existency in Convex Nonlinear Programming

    Proceedings of 20th Int'l Conference on Computers & Industrial Engineering, page. 469 - 472, 1996-10-06

    Conference
    Regression by Least Absolute Value Method with L1-constraint on Parameters

    INFORMS, page. 226

    Conference
    Integrative approaches for identifying cis-regulatory modules of co-expressed genes

    7th International Conference of KSBI

    Conference
    A pattern adjusted distance measure for time course microarray data

    7th International Conference of KSBI

    Conference
    A rule-based recognition of spatial defect patterns on semiconductor wafers

    Proceedings of the 7th APIEMS Conference, page. 1304 - 1310

    Conference
    A New Calibration Method based on the Recursive Multiple Linear Regression Coefficients with Variable Selection/Feature Construction

    NFORMS International Hawaii 2001

    Conference
    Moment of Time to Failure of a Non-Repairable System Subject to Heterogeneous Random Shocks

    INFORMS International Hawaii 2001

    Conference
    Search for the Optimal Number of Clusters and Selection of Useful Features

    INFORMS International Hawaii 2001

    Conference
    A Comparison of Variable Selection Methods Using Simulation

    INFORMS, page. 226

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