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JEONG, YOON HA(정윤하)
Department
Dept of Electrical Engineering(전자전기공학과)
Major(s)
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Co-researchers

    Keyword

    Publication & Time Cited Count (For the Last 5 years)

    Results 1-14 of 14 (Search time: 0.001 seconds).
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    Date issued

    Applied search limites :
    Date Issued : [2000 TO 2009] Date Issued : 2009
    Conference
    Hot Electron Degradation Effects in 35-nm InAlAs/InGaAs Metamorphic HEMT

    2009 IEEK FALL CONFERENCE, 2009-11-28

    Conference
    도허티 증폭기의 아날로그 전치왜곡 선형화

    2009 년도 추계 마이크로 및 전파 학술대회, page. 88 - ., 2009-09-25

    Conference
    Inverse Class-E 구조를 이용한 고효울 전력증폭기

    2009 년도 추계 마이크로 및 전파 학술대회, page. 81 - ., 2009-09-24

    Conference
    Breakdown Voltage Simulation of AlGaN/GaN High Electron Mobility Transistor with Al0.30Ga0.70N Back Barrier

    2009 IEEK Summer Conference, page. 504, 2009-07-09

    Conference
    A Model of Organic Thin-film Transistors Based on the Variable Range Hopping Transfer Mechanism with Lateral Field-Dependency

    2009 IEEK Summer Conference, 2009-07-08

    Conference
    RF Degradation of Short Channel Metal Gate/High-k Dielectric nMOSFET by Hot Carrier Effect

    2009 IEEK Summer Conference, 2009-07-08

    Conference
    Memory Effect Reduction of Power Amplifier at High Drain Bias

    2009 IEEK Summer Conference, page. 173 - 173, 2009-07-08

    Conference
    New Analog Predistorter with Memory Effect Compensation,

    2009 IEEK Summer Conference, page. 175 - 175, 2009-07-08

    Conference
    Linearity Improvement of Highly Efficient GaN HEMT Doherty Power Amplifier with Wideband Digital Predistortion

    2009 IEEK Summer Conference, page. 181 - 181, 2009-07-08

    Conference
    35 nm T-gate In0.52Al0.48As/In0.53Ga0.47As/GaAs Metamorphic HEMTs with an Ultrahigh fmax of 610 GHz

    16th Korean Conference on Semiconductors, 2009-02-19

    Conference
    Variable Range Hopping 기반 전류 모델을 이용한 OTFT의 파라메터 추출 기법

    16th Korean Conference on Semiconductors, page. 466 - 467, 2009-02-19

    Conference
    RF Characteristics in Metal Gate/high-k Dielectric nMOSFETs at Cryogenic Temperature

    16th Korean Conference on Semiconductors, 2009-02-18

    Conference
    DC and Reliability Characteristics of 45 nm Node MOSFETs With Using HfSiON/TiN Gate Stacks

    16th Korean Conference on Semiconductors, 2009-02-18

    Conference
    Effective Mobility Extraction of the Advanced MOSFETs Using RF Modeling

    16th Korean Conference on Semiconductors, 2009-02-18

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