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JEONG, YOON HA(정윤하)
Department
Dept of Electrical Engineering(전자전기공학과)
Major(s)
-

Co-researchers

    Keyword

    Publication & Time Cited Count (For the Last 5 years)

    Results 1-12 of 12 (Search time: 0.001 seconds).
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    Date issued

    Applied search limites :
    Date Issued : [2010 TO 2014] Date Issued : 2011
    Conference
    A highly efficient dual-band inverse class-E power amplifier with double CRLH-TLs for LTE and WCDMA applications

    Asia-Pacific Microwave Conference, 2011-12-07

    Conference
    High-Efficiency Inverse Class-E Power Amplifier Using Double CRLH-TL for 3.5 GHz WiMAX Applications

    Asia-Pacific Microwave Conference, 2011-12-07

    Conference
    Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique

    IEEE Nanotechnology Materials and Devices, 2011-10-20

    Conference
    Analysis of Bottom Channel Effect in Silicon Nanowire FET based on Bulk-Silicon: Reduction of Parasitic Capacitance caused by SiGe layer

    2011 International Conference on Solid State and Device Materials, 2011-09-29

    Conference
    Hot Carrier Effect on RF Characteristics of High-k/Metal Gate SiGe Channel pMOSFETs

    2011 International Conference on Solid State and Device Materials, 2011-09-29

    Conference
    Analysis of Parasitic Bottom Capacitance in n- and p-type Si-Nanowire Field Effect Transistors on Bulk

    International Conference on Nanotechnology, 2011-08-16

    Conference
    Fabrication and Characterization of Gate-All-Around Silicon Nanowire Field Effect Transistors

    International Conference on Nanotechnology, 2011-08-16

    Conference
    Comparative study of fabricated junctionless and inversion-mode nanowire FETs

    Device Research Conference, 2011-06-21

    Conference
    Highly Efficient Three-Stage Doherty Power Amplifier with Adaptive Driving Amplifier for 3.5 GHz WiMAX Applications

    IEEE International Microwave Symposium, 2011-06-09

    Conference
    New Investigation of Hot Carrier Degradation of RF Small-Signal Parameters in High-k/Metal Gate nMOSFETs

    International Reliability Physics Symposium, 2011-04-14

    Conference
    Low-Frequency Noise Behavior of La-Doped HfSiON/Metal Gate nMOSFETs

    International Reliability Physics Symposium, 2011-04-14

    Conference
    pH Sensing and Noise Characteristics of Si Nanowire Ion-Sensitive Field Effect Transistors

    IEEE International Conference on Nano/Micro Engineered and Molecular Systems, 2011-02-22

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