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BAEK, ROCK HYUN(백록현) scopus

Department: Dept of Electrical Engineering(전자전기공학과)

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Results 21-34 of 34 (Search time: 0.002 seconds).

Conference

Low Frequency Noise in SiC Double-Implant MOSFETs

제25회 한국반도체학술대회 (KCS 2018), 2018-02-07

Conference

Improved Thermal Stability and Lower Sheet Resistance of NiSi with Carbon Pre-silicidation Implant

제25회 한국반도체학술대회 (KCS 2018), 2018-02-06

Conference

Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress

18th Korean Conference on Semiconductors (2011), 2011-02-16

Conference

GIDL analysis of underlap double gate MOSFET with variable channel thickness and doping using quantum simulation

대한전자공학회 하계학술대회 2010, 2010-06-16

Conference

Comparative study on device performance of Junctionless double-gate MOSFET

대한전자공학회 하계학술대회 2010, 2010-06-16

Conference

Accurate Extraction of Volume Trap Density from Si-Nanowire FET using the Newly Developed Cylindrical Coordinate Based 1/f noise model

17th Korean Conference on Semiconductors (2010), 2010-02-24

Conference

Fabrication, DC and Low Frequency Noise Characteristics of Silicon Nanowire FET

대한전자공학회 추계학술대회 2009, 2009-11-28

Conference

Hot Electron Degradation Effects in 35nm InAlAs/InGaAs Metamorphic HEMT

대한전자공학회 추계학술대회 2009, 2009-11-28

Conference

RF degradation of short channel metal gate/high-k dielectric nMOSFET by hot carrier effect

대한전자공학회 하계학술대회 2009, 2009-07-08

Conference

Effective Mobility Extraction of the Advanced MOSFETs Using RF Modeling

16th Korean Conference on Semiconductors (2009), 2009-02-18

Conference

RF characteristics in Metal Gate/High-K Dielectric nMOSFETs at cryogenic temperature

16th Korean Conference on Semiconductors (2009), 2009-02-18

Conference

DC and Reliability Characteristics of 45nm Node MOSFETs with using HfSiON/TiN Gate Stacks

16th Korean Conference on Semiconductors (2009), 2009-02-18

Conference

70nm CMOS BSIM4 Macro modeling for RFIC design

대한전자공학회 하계학술대회 2006, 2006-06-21

Conference

Optimized scalable I-V Modeling for 70nm Gate length Nano-CMOS using BSIM4

대한전자공학회 하계학술대회 2005, 2005-06-24

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