Microelectronics Reliability, vol. 64, page. 194 - 198, 2016-09
JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 55, no. 8, 2016-08
Microelectronics Reliability, vol. 59, page. 13 - 17, 2016-04
IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 30, no. 10, page. 5776 - 5782, 2015-10
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, vol. 62, no. 9, page. 5491 - 5501, 2015-09
IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 29, no. 12, page. 6332 - 6341, 2014-12
MICROELECTRONICS RELIABILITY, vol. 54, no. 11, page. 2383 - 2387, 2014-11
JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 53, no. 8, page. 10 - 13, 2014-08
DISPLAYS, vol. 35, no. 2, page. 66 - 73, 2014-04
JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 53, no. 4, 2014-04
Thin Solid Films, vol. 544, page. 129 - 133, 2013-10-01
Microelectronic Reliability, vol. 53, no. 9-11, page. 1351 - 1354, 2013-09
SOLID-STATE ELECTRONICS, vol. 81, page. 5 - 7, 2013-03
Microelectronics Reliability, vol. 52, no. 9, page. 1905 - 1908, 2012-09
Microelectronics Reliability, vol. 52, no. 9-10, page. 1901 - 1904, 2012-09
Microelectronics Reliability, vol. 52, no. 9-10, page. 1949 - 1952, 2012-09
Electronics Letters, vol. 48, no. 18, page. 1151 - U186, 2012-08-30
IEEE Transactions on Industrial Electronics, vol. 59, no. 4, page. 1808 - 1814, 2012-04
Microelectronic Engineering, vol. 91, page. 44 - 49, 2012-03
Japanese Journal of Applied Physics, vol. 51, no. 2, 2012-02