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JEONG, YOON HA(정윤하)

Department: Dept of Electrical Engineering(전자전기공학과)

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Publication & Time Cited Count (For the Last 5 years)

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Date Issued : [2010 TO 2016] Date Issued : 2013

Article

Reliability study of methods to suppress boron transient enhanced diffusion in high-k/metal gate Si/SiGe channel pMOSFETsSCIESCOPUS

Microelectronic engineering, vol. 112, page. 80 - 83, 2013-12

Article

Study on a Scaling Length Model for Tapered Tri-gate FinFET based on 3-D Simulation and Analytical AnalysisSCIESCOPUS

IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 60, no. 9, page. 2721 - 2727, 2013-09

Article

Improved Electrical Characteristics of Honeycomb-Nanowire ISFETsSCIESCOPUS

IEEE ELECTRON DEVICE LETTERS, vol. 34, no. 8, page. 1059 - 1061, 2013-08

Article

Simple S/D Series Resistance Extraction Method Optimized for Nanowire FETsSCIESCOPUS

IEEE Electron Device Letters, vol. 34, no. 7, page. 828 - 830, 2013-07

Article

Investigation of the electrical stability of Si-nanowire biologically sensitive field-effect transistors with embedded Ag/AgCl pseudo reference electrodeSCIESCOPUS

RSC Advances, vol. 3, no. 21, page. 7963 - 7969, 2013-06

Article

A Wideband Distributed Amplifier Employing an Envelope Tracking TechniqueSCIESCOPUS

IEEE Microwave and Wireless Components Letters, vol. 23, no. 6, page. 312 - 314, 2013-06

Article

Analytic model of S/D series resistance in trigate finfets with polygonal epitaxySCIESCOPUS

IEEE TRANSACTONS ON ELECTRON DEVICES, vol. 60, no. 4, page. 1302 - 1309, 2013-04

Article

Improved Degradation and Recovery Characteristics of SiGe p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors under Negative-Bias Temperature StressSCIESCOPUS

Japanese Journal of Applied Physics, vol. 52, no. 4, page. 4CC21-1 - 4CC21-4, 2013-04

Article

High-efficiency inverse class-E power amplifier with envelope tracking techniqueSCIESCOPUS

Microwave and Optical Technology Letters, vol. 55, no. 4, page. 866 - 869, 2013-04

Article

Improved performance of In2Se3 nanowire phase-change memory with SiO2 passivationSCIESCOPUS

Solid-State Electronics, vol. 80, page. 10 - 13, 2013-02

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