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BAEK, ROCK HYUN(백록현) scopus

Department: Dept of Electrical Engineering(전자전기공학과)

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Publication & Time Cited Count (For the Last 5 years)

Results 1-20 of 34 (Search time: 0.002 seconds).

Conference

Novel scheme to form non-uniform oxide in gate-all-around NCFETs for capacitance matching

제 30회 한국반도체학술대회, 2023-02-15

Conference

BCl3/Cl2 plasma etching process of ferroelectric gate stack for device integration

제 30회 한국반도체학술대회, 2023-02-15

Conference

Analysis of Mechanical Stress on Charge Trap Nitride (CTN) for Program Operation in 3D NAND Flash Memory

제 30회 한국반도체학술대회, 2023-02-15

Conference

Neural Network-based Prediction for Cross-Temperature Induced VT Distribution Shift of 3D NAND flash memory

제 30회 한국반도체학술대회, 2023-02-15

Conference

Improved ISPP Scheme of 3-D NAND Flash for Narrow Threshold Voltage Distribution

제 29회 한국반도체학술대회, 2022-01-26

Conference

Sensitivity Analysis of Each Inner Spacer Thickness Variation in Sub 3-nm Node Si Nanosheet FETs

제 29회 한국반도체학술대회, 2022-01-25

Conference

PEALD with Post-treatments for Interface Improvement of HfO2-based Metal-Insulator-Semiconductor Structures

제 29회 한국반도체학술대회, 2022-01-25

Conference

Improving Program Efficiency of 3D NAND Cell Structure Based on Artificial Neural Network

2021년도 대한전자공학회 하계종합학술대회, 2021-07-01

Conference

Si Gate-All-Around Nanosheet FET: the Key Enabler of 3nm Technology Node

제 28회 반도체학술대회, 2021-01-28

BAEK, ROCK HYUN

Conference

Power, Performance and Area Analysis of Source/Drain Patterning n/p FinFETs based 6T-SRAM cell for 3-nm technology node

제 27회 반도체학술대회, 2020-02-14

Conference

Defect Curing Effects on High-k Gate Stack (Al/Al2O3/Si-sub) by Using H2 Plasma Treatment and Rapid Thermal Anneal

제 27회 반도체학술대회, 2020-02-14

Conference

Demonstration of TiO2 based ultra high-k (k=30) MIS capacitor and its electrical properties

제 27회 반도체학술대회, 2020-02-14

Conference

The Origin of Incremental Step Pulse Programming (ISPP) Slope Degradation in NAND Flash Memory

제 27회 반도체학술대회, 2020-02-13

Conference

Observation of Mobility and Velocity Behaviors in Ultra Scaled Lg=15 nm Silicon Nanowire pMOSFETs with Different Channel Diameters

제26회 한국반도체학술대회 (KCS 2019), 2019-02-15

Conference

Vth Variation Induced by S/D Mole Fraction and Si/SiGe Intermixing of Si-NSFETs

제26회 한국반도체학술대회 (KCS 2019), 2019-02-14

Conference

Design Strategy of 20nm node single PRAM cell based on TCAD Simulation

제1회 반도체공학회 학술대회, 2018-12-21

Conference

Geometric Optimization of Silicon Gate-All-Around Field-Effect Transistors (GAAFETs) for DC/AC Performances

제1회 반도체공학회 학술대회, 2018-12-21

Conference

Observation of Mobility and Velocity as Channel Diameter Change in the Shrunk Lg = 18nm Silicon Nanowire MOSFETs

제1회 반도체공학회 학술대회, 2018-12-21

Conference

Effect of Elliptical Channel Shape on Memory Characteristics of Vertical 3D NAND Flash Memory

한국반도체디스플레이기술학회 2018년 추계학술대회, 2018-11-22

Conference

An Analysis on Electrical Characteristics of Submicron-LTPS Thin-Film-Transistors

한국반도체디스플레이기술학회 2018년 추계학술대회, 2018-11-22

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